PUBLICATIONS

Accelerator Mass Spectrometry

2010

  • Measurement of Fast Neutron Total Cross Sections on O, Si, and SiO2

    G.D. Kim, H.W. Choi, H.J. Woo, W. Hong
    J. Kor. Phys. Soc., 57(3) (2010) 424-439.

  • Hydrogen analysis in diamond like carbon by elastic recoil detection.

    J.K. Kim, H.W. Choi, H.J. Woo and G.D. Kim.
    Current Applied Physics 10 (2010) 498-502.

  • Activation Cross Section Measurements of 16O(n,t) above 18.1 MeV up to 33.1 MeV.

    J.H. Park, G.D. Kim, W. Hong, C.S. Lee, Y.K. Kwon, K.B. Lee and J.H. Kim.
    J. Radioanal Nucl Chem (2010) 285:399.

  • Energy and Fluence Measurements for Fast Neutrons from the 2D(d,n)3He Reaction.

    G.D. Kim, H.J. Woo, J.K. Kim and H.W. Choi.
    J. Kor. Phys. Soc. 56(6) (2010) 1172-1776.

2009

  • Blistering kinetics of GaN by hydrogen implantation at high temperature.

    H.J. Woo, H.W. Choi, W. Hong, J.H. Park, C.H. Eum.
    Surface & coatings Technology 203 (2009) 2375-2379.

  • Blistering/exfoliation kinetics of GaAs by hydrogen and helium implantations.

    H.J. Woo, H.W. Choi, G.D. Kim, J.K. Kim, K.J. Kim.
    Surface & coatings Technology 203 (2009) 2370-2374.

  • Patterned exfoliation of GaAs based on masked helium implantation and subsequent rapid thermal annealing.

    H.J. Woo, H.W. Choi, G.D. Kim, W. Hong and J.K. Kim.
    AIP Conference Proceedings 1099 (2009) 535-538.

  • Fabrication of GaAs on Si hetero-structures by helium implantation and direct wafer bonding.

    H.J. Woo, H.W. Choi, G.D. Kim, J.K. Kim.
    J. Kor. Phys. Soc. 54(5) (2009) 2060-2065.

  • Mono-energetic Neutron Source using the 7Li(p,n)7Be Reaction.

    G.D. Kim, H.J. Woo, W. Hong and Y.K. Kim.
    Journal of Korean Physical society 55(4) (2009) 1401-1408.

  • Time of Flight system for MeV Neutron.

    G.D. Kim, H.W. Choi, H.J. Woo and Y.K. Kim.
    Journal of the Korean Physical Society 54(4) (2009) 1465-1469.

2008

  • Industrial-purpose heavy ion accelerator, the present state and prospect of the accelerator technology development.

    H.J. Woo.
    Radioisotope Journal, Winter 2008, pp. 14-28.

  • Development of Ion-Beam Nano-Structuring Techniques in KIGAM.

    H.J. Woo, G.D. Kim, J.K. Kim, H.W. Choi, W. Hong, J.H. Park and K.J. Kim.
    J. Kor. Phys. Soc. 52(3) (2008/03) 743-751.

  • Proton-Induced Gamma-ray Emission System with a Compton Suppression Detetctor and Polsed Beam.

    G.D. Kim, H.W. Choi, H.J. Woo and Y.K. Kim.
    Journal of Korean Physical society 53(4) (2008) 1859-1865.

2007

  • Low energy ion beam monitoring system by dosimetry film and particle induced X-ray.

    H.W. Choi, H.J. Woo, J.H. Park, G.D. Kim, J.K. Kim, W. Hong, C.H. Eum.
    Nucl. Instr. Meth. B 261 (2007) 102-105.

  • Proton Implantation Mechanism in GaN Layer Transfer by Ion-cut Process.

    H.J. Woo, H.W. Choi, G.D. Kim, W. Hong, J.K. Kim, and C.H. Eum.
    J. Kor. Phys. Soc. 50(5) (2007/05) 1542-1547.

  • Dose rate factor of soil by the beta-rays and gamma-rays from 235,238U, 232Th and 40K.

    G.D. Kim, C.H. Eum and J.H. Bang.
    Korea Analytical Science & Technology 20(6) (2007) 460-467.

  • Measurements of Fast Neutron Capture Cross Sections on 63Cu and 186W.

    G.D. Kim, H.J. Woo, H.W. Choi, N.B. Kim, T.K. Yang, J.H. Chang and K.S. Park.
    The Journal of Radioanalytical and Nuclear Chemistry 271(3) (2007) 553-558.

  • Design of Nanosecond Beam Bunching System.

    G.D. Kim, W. Hong, H.J. Woo, J.K. Kim, C.H. EUM, J.H. Chang and K.S. Park.
    The Journal of Radioanalytical and Nuclear Chemistry 271(3) (2007) 547-552.

  • Production of Mono-Energetic MeV-range Neutrons by 3T(p,n)3He Reaction.

    G.D. Kim, H.J. Woo. J.K. Kim, T.K. Yang and J.H. Chang.
    The Journal of Radioanalytical and Nuclear Chemistry 271(3) (2007) 541-546.

  • Prompt Gamma-Ray Spectrometer for Analysis of Nuclear Reaction.

    G.D. Kim, H.J. Woo, J.K. Kim, W. Hong, H.W. Choi and Y.O. Lee.
    Journal of Korean Physical society 50(5) (2007) 1528-1533.

  • Fast Neutron Facility of KIGAM.

    G.D. Kim, H.J. Woo, W. Hong, J.K. Kim, H.W. Choi and Y.O. Lee.
    Journal of Korean Physical Society 51(1) (2007) 24-29.

2006

  • Quantitative analysis of hydrogen in thin film by scattering-recoil co-measurement technique.

    H.R. Lee, C.H. Eum, H.W. Choi and J.K. Kim.
    Analytical Science & Technology 19(5) (2006) 400-406.

  • Hydrogen ion implantation mechanism in GaAs-on-insolator wafer formation by ion-cut process.

    H.J. Woo, H.W. Choi, J.K. Kim, G.D. Kim, W. Hong, H.R. Lee.
    Proceedings on ‘16th International Conference on Ion Implantation Technology (IIT2006)’, June 11-16, 2006, Marseille, France, AIP(American Institute of Physics) Conference Proceedings 866 (Nov. 2006), pp. 308-312.

  • Hydrogen ion implantation mechanism in GaAs-on-insolator wafer formation by ion-cut process.

    H.J. Woo, H.W. Choi and J.K. Kim.
    Journal of Semiconductor Technology and Science 6(2) (2006) 95-100.

  • Semiconductor layer transfer by wafer direct bonding and ion-cut techniques.

    H.J. Woo, H.W. Choi, G.D. Kim, Y.H. Bae, W.B. Choi, S.W. Choi.
    New Physics 53(2) (2006, 8) 1-15.

  • Nanoseconfd Beam Bunching System.

    G.D. Kim, H.J. Woo, W. Hong, J.K. Kim, H.W. Choi, H.R. Lee.
    J. Kor. Phys. Soc. 48(4) (2006) 741-746.

2005

  • Enhancement and quenching of photoluminescence in Si nanocrystals embedded in silicon dioxide by phosphorous doping.

    J.K. Kim, H.W. Woo, H.W. Choi, G.D. Kim, W. Hong.
    J. Kor. Vac. Soc. 14 (2005) 78.

  • Fabrication of SOI wafer by ion-cut process and its characterization.

    H.J. Woo, H.W. Choi, Y.H. Bae, W.B, Choi.
    J. Kor. Vac. Soc. 14 (2005) 1.

  • Thick Si-on-insolator wafers formation by ion-cut process.

    H.J. Woo, H.W. Choi, J.K. Kim, G.D. Kim, W. Hong, W.B. Choi, Y.H. Bae.
    Nucl. Instr. Meth. B241 (2005) 531-535.

  • Analysis of Tritium in Ti-3H Thin Film Target by ERD-TOF and (d,α) Reaction.

    G.D. Kim, J.K. Kim, W. Hong, H.J. Woo, H.W. Choi.
    Journal of Surface Analysis 12(2) (2005) 227-231.

  • Total porosity measurement of model material of geological stratum by using transmission of fast neutron.

    G.D. Kim, C.H. Eum, S.H. Whang, H.J. Woo, W. Hong, J.K. Kim, H.W. Choi.
    J. of Korean Society for Geosystem Engineering 42(4) (2005) 249-263.

2004

  • Characteristics of SOI Structure with Buried Alumina Layer.

    J.W. Kwon, K.W. Kwon, J.H. Lee, Y.H. Bae, C.S. Cho, S. Cristoloveanu, K. Oshima, and H.J. Woo.
    J. Kor. Phys. Soc. 45 (2004) 693-696.

  • Enhancement effect of photoluminescence in Si nanocrystals by phosphorus implantation.

    J.K. Kim, H.J. Woo, H.W. Choi, G.D. Kim and W. Hong.
    R9.20.1 Mat. Res. Soc. Symp. Proc. Vol. 792 ⓒ 2004 Materials Research Society.

  • Encapsolated silicon nanocrystals formed in silica by ion beam synthesis.

    H.W. Choi, H.J. Woo, J.K. Kim, G.D. Kim, W.Hong and Y.Y. Ji.
    Boll. Korean Chem. Soc. 25(4) (2004) 525.

  • Proton implantation mechanism involved in the fabrication of SOI wafer.

    H.J. Woo, H.W. Choi, J.K. Kim, Y.Y. Ji.
    J. Korean Vacuum Society, Vol. 13, No. 1 (2004) 1-8.

2003

  • Thin Film Analysis by Ion Beam Techniques.

    W. Hong, G D. Kim, H. J. Woo, H. W. Choi and J. K. Kim.
    Proc. of Conf. of Acc. and Appl., 2003.

  • Revisiting the stopping powers of Si and SiO2 for 4-He ions: 0.5 MeV - 2.0 MeV.

    W.N. Lennard, H. Xia, J.K. Kim.
    Nucl. Instr. Meth. B (2003).

  • Depth profiling of ultrathin films using medium energy ion scattering.

    J.K. Kim, W.N. Lennard, C.P. McNorgan, J. Hendriks, I.V. Mitchell, D. Landheer, J. Gredle.
    Current Applied Physics 3 (2003) 75-78.

  • Charge buildup effect during ion beam irradiation on insulator and its suppression by deposition of thin metal film.

    J.K. Kim, W. Hong. H.J. Woo and C. H. Eum.
    J. Kor. Phys. Soc. 43(4) (2003) 582-584.

  • Study on the proton implantation process for the fabrication of SOI wafer.

    H.J. Woo, H.W. Choi, J.K. Kim, W. Hong, G.D. Kim.
    Proceeding of 2003 KAPRA & KPS/DPP Joint Workshop (2003).

  • The Current Status of bunching system at KIGAM.

    G.D. Kim, W. Hong, Y.S. Kim. H.J. Woo, Y.Y. Gi, H.W. Choi, and J.H. Chang.
    2003 Workshop proceeding for Nuclea Data Production and Evaluation, Vol. 5 (2003).

  • Gamma-ray on-line irradiation system for the measurement of erosion in piping.

    G.D. Kim and W. Hong.
    J. of KIEEME 16(4) (2003) 38.

  • Energy distributions and Yields of Secondary Electrons from a Clean Au Target bombarded by High-Energy H+, D+, He+, O2+ and Cl2+ - 5+.

    G.D. Kim, W. Hong, J.K. Kim, H.W. Choi, H.J. Woo, and J.H. Chang.
    J. Kor. Phys. Soc. 42(3) (2003) 335-338.

2002

  • Ion Beam Lithography Using Membrane Masks.

    Y.S. Kim, W. Hong, H.J. Woo, H.W. Choi, G.D. Kim, H.H. Lee, S. Lee.
    Jpn. J. Appl. Phys. 41 (2002) 4141-4145.

  • Surface sensitive particle-induced Z-ray emission.

    W.N. Lennard, J.K. kim, L. Rodriguez-Fernande.
    Nuclear Instruments and Methods in Physics Research 189 (2002) 49.

  • The Nanosecond bunching system at the KIGAM Tandem accelerator.

    G.D. Kim, W. Hong, Y.S. Kim. H.J. Woo, H.W. Choi, and J.H. Chang.
    2002 Workshop proceeding for Nuclea Data Production and Evaluation, Vol. 4 (2002) 110.

  • A study on the proton LIGA technique.

    H.W. Choi, H.J. Woo, W. Hong, G.D. Kim.
    KIGAM Bulletin 6(1) (2002).

  • Direct Electron-Beam Writing With High Aspect Ratio For Fabricating Ion-Beam Lithography Mask.

    Byung-Nam Lee, Yong-Hoon Cho, Young-Seok Kim, Wan Hong, Hyung-Joo Woo.
    Proceedings of 2002 International Conference on Semiconductor (2002).

2001

  • Optical property modification of PMMA by ion-beam implantation.

    W. Hong, H.J. Woo, H.W. Choi, Y.S. Kim, G.D. Kim.
    Applied Surface Science 169-170 (2001) 428-432.

  • Structural modification of poly(methyl methacrylate) by proton irradiation.

    H.W. Choi, H.J. Woo, W. Hong, J.K. Kim, S.K. Lee, C.H. Eum.
    Applied Surface Science 169-170 (2001) 433-437.

  • Optimisation of microlenses fabricated by deep proton irradiation and styrene diffusion.

    H.J. Woo, Y.S. Kim, H.W. Choi, W. Hong, S Lee, M. Kufner, S. Kufner.
    Microelectronic Engineering 57-58 (2001) 945-951.

  • Design and fabrication of nuclear microprobe.

    H.J. Woo, J.K. Kim, H.W. Choi, W. Hong, Y.S. Kim, J.H. Lee, G.D. Kim, T.G. Yang.
    Journal of Korean Vacuum Society 10(3) (2001) 380-386.

  • Characteristic Analysis for a TiT Target Using Nuclear Reactions.

    G.D. Kim, T.K. Yang, J.K. Kim, Y.S. Kim, W. Hong, H.W. Choi, H.J. Woo, and J.H. Chang.
    J. Kor. Phys. Soc. 38(4) (2001) 299.

  • Neutron Capture Cross sections from 1 MeV to 2 MeV by Activation Method.

    G.D. Kim, T.K. Yang, Y.S. Kim. H.J. Woo, H.W. Choi, W. Hong, and J.H. Chang.
    2001 Workshop proceeding for Nuclear Data Production and Evaluation, Vol. 3 (2001) 53.

  • Thermal stability and diffusion in gadolinium silicate gate dielectric film.

    D. Landheer, X. Wu, J Morais, I.J.R. Baumvol, P.P. Pezzi, L. Miotti, W.N. Lennard, J.K. Kim.
    Applied Physics letter 79(1) (2001).

2000

  • Analysis of Light Elements by PIGE.

    Y.S. Kim, H.W. Choi, D.K. Kim, H.J. Woo, N.B. Kim and K.S. Park.
    Anal. Sci. and Tech. 13 (2000) 12.

  • Application and present status of ion beam analyses.

    Y.S. Kim and H.J. Woo.
    Physics and High Technology 9(9) (2000).

  • Lifetimes of Excited Level in 32S from the Doppler Shift Attenuation Method.

    T.K. Yang, S.T. Park, B.K. Seo, H.C. Kim, D.W. Lee, G.D. Kim, S.Y. Lee, M. Igashira.
    J. Kor. Phys. Soc. 37(5) (2000) 512-518.

  • Determination of impurities in gallium oxide by NAA.

    N.B. Kim, H.J. Woo, K.Y. Lee, Y.Y. Yoon, S.K. Chun, K.S. Park.
    Journal of Radioanalytical and Nuclear Chemistry 245(1) (2000) 37-40.

  • Measurement of Neutron energy and Flux of KIGAM's Neutron Facility.

    G.D. Kim, T.K. Yang, J.K. Kim, Y.S. Kim. W. Hong, H.W. Choi, H.J. Woo, and J.H. Chang.
    2000 Workshop proceeding for Nuclea Data Production and Evaluation, Vol. 2, (2000) 65.

1999

  • Light Element Analysis in Steel by High-Energy Heavy-Ion TOF-ERDA.

    Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Yohichi Gohshi.
    Spectrochimica Acta B54 (1999)151.

  • A wavelength dispersive X-ray spectrometer for small area X-ray fluorescence spectroscopy at SPring-8 BL39XU.

    Shinjiro Hayakawa, Akihisa Yamaguchi, Wan Hong, Yohichi Gohshi, Tokujiro Yamamoto, Kouichi Hayashi, Jun Kawai, Shunji Goto.
    Spectrochimica Acta, B54 (1999)171.

  • Stimulated emission at 326 nm and an ultrafast 100-ps-lived luminescence component by ion irradiation of α-alumina.

    Kazuie Kimura, Junichi Kaneko, Sumit Sharma, Wan Hong, Noriaki Itoh.
    Physical Review B 60 (1999) 12626.

  • SAMPLE TREATMENT TECHNIQUES FOR THE DETERMINATION OF ENVIRONMENTAL RADIOCARBON IN THE NUCLEAR POWER STATION AREA.

    H.J. Woo, S.Y. Cho, S.K. Chun, Y.S. Kim, and D.W. Kang.
    Journal of Radioanalytical and Nuclear Chemistry 239(3) (1999) 533.

  • OPTIMIZATION OF LIQUID SCINTILLATION COUNTING TECHNIQUES FOR THE DETERMINATION OF CARBON-14 IN ENVIRONMENTAL SAMPLES.

    H.J. Woo, S.K. Chun, S.Y. Cho, Y.S. Kim, and D.W. Kang.
    Journal of Radioanalytical and Nuclear Chemistry 239(3) (1999) 649.

  • A Study on the Quantitative Recovery of Dissolved Inorganic Carbonates in Ground Water for Radiocarbon Measurement.

    H.J. Woo, S.K. Cheon, S.Y. Cho.
    Analytical Science and Technology 12(4) (1999) 284-289.

  • The Determination of C-14 in Stack Effluent Gases by Carbonate Suspension Counting Method.

    H.J. Woo, S.K. Cheon, S.Y. Cho.
    Analytical Science and Technology 12(4) (1999) 279-283.

  • Development of Measuring Facility for  Fast Neutron Capture Cross Section.

    G.D. Kim, Y.S. Kim, J.K. Kim, H.W. Choi, and J.H. Chang.
    1999 Workshop proceeding for Nuclea Data Production and Evaluation, Vol. 1 (1999) 3.

1998

  • High energy Ion Implantation System with Tandem Accelerator.

    Y.S. Kim, H.J. Woo, H.W. Choi, G.D. Kim, J.K. Kim and H.K. Shin.
    Journal of Korean Vacuum Society 2(1) (1998) 31.

  • ERD-TOF and HIRBS with 1.7MV Tandem Accelerator.

    Y.S. Kim, J.K. Kim, H.W. Choi, G.D. Kim and H.J. Woo.
    Nuclear Instruments and Methods B136-138 (1998) 724-728.

  • Optimization of CO2 Direct Absorption Method for the Determination of Carbon-14 in Environmental Samples.

    Y. Cho, H.J. Woo and S.K. Chun.
    Journal of Korean Association for Radiation Protection 23(4) (1998) 237.

  • Extremely fast decay component of UV luminescence from 2-MeV/amu ion irradiated alumina.

    Kazuie Kimura, W. Hong, Junichi Kaneko, Noriaki Itoh.
    Nuclear Instruments and Methods B141 (1998) 425.

  • Decay enhancement of self-trapped excitons at high density and low temperature in an ion-irradiated BaF2 single crystal.

    Kazuie Kimura, W. Hong.
    Physical Review B 58 (1998) 6081.

  • A TOF spectrometer for elastic recoil detection.

    J.K. Kim, Y.S. Kim, G.D. Kim, H.W. Choi, H.J. Woo and C.N. Whang.
    Nucl. Instr. Meth. B140 (1998) 380.

  • Analysis of Chlorine in used Oils by External Beam PIXE-PIGE.

    H.W. Choi, Y.S. Kim, G.D. Kim, H.J. Woo and J.K. Kim.
    Nuclear Instruments and Methods B136-138 (1998) 1018-1022.

  • Elastic Recoil Detection by Time of Flight System for Analysis of Light Elements in  Thin Film.

    G.D. Kim, J.K. Kim, Y.S. Kim, H.W. Choi, H.J. Woo, S.Y. Jho, and C.N. Whang.
    Journal of the Korean Physical Society 32(5) (1998) 739-743.

1997

  • Improvement in the Detection Limits of Elastic Recoil Detection Analysis (ERDA) Using a Time-of-Flight Detection.

    Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura, Yohichi Gohshi and Isao Tanihata.
    Jpn. J. Appl. Phys. 36 (1997) L952.

  • Development of a high mass-resolution TOF-ERDA system for a wide mass range from hydrogen to Middle Heavy Elements.

    Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura, Yohichi Gohshi and Isao Tanihata.
    Anal. Sci. 13 (1997) 365.

  • Development of a high mass-resolution TOF-ERDA system for a wide mass range.

    Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura, Yohichi Gohshi and Isao Tanihata.
    Nucl. Instr. Meth. B124 (1997) 95.

  • Determination of the Mass Resolution and the Depth Resolution of Time of Flight Elastic Recoil Detection Analysis Using Heavy Ion Beams.

    Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura, Yohichi Gohshi and Isao Tanihata.
    Jpn. J. Appl. Phys. 36 (1997) 5737.

  • Lifetime Measurements for the 13351-keV Level of 24Mg.

    T.K. Yang, B.K.Seo, D.W.Lee, J.H. Lee, G.D. Kim Y.S. Kim, Y.G. Min, T.I.Ro,S.Y.Lee, S.T. Park, M. Igashira.
    J. Kor. Phys. Soc. 31(4) (1997) 584-589.

  • Measurement of elastic recoil cross sections of light nuclei by 35Cl using inverse scattering.

    J.K. Kim, Y.S. Kim, H.W. Choi, G.D. Kim, H.J. Woo, C.N. Whang.
    Nuclear Instruments and Methods B129 (1997) 323-326.

  • Study of the Nuclear Shakeoff in (EC+β+) Decay Nucleus.

    H.J. Cho, S.K. Nha, G.D. Kim.
    J. Kor. Phys. Soc. 30(2) (1997) 180-185.

1996

  • Analysis of an Ancient Bronze Statue by External Beam PIXE.

    N.B. Kim, D.K. Kim, H.W. Choi, Y.S. Kim, H.J. Woo and K.S. Park.
    Journal of Radioanalytical and Nuclear Chemistry 192(1) (1995) 147.

  • A Study of 222Rn and 226Ra Analysis in the Ground Water by LSC.

    H.J. Woo, Y.Y. Yoon, S.Y. Cho and S.K. Chun, J..
    Korean Asso. Radiat. Prot. 20(4) (1995) 275.

  • An ERD-TOF System for the Depth Profiling of Light Elements.

    Y.S. Kim, H.J. Woo, J.K. Kim, D.K. Kim, H.W. Choi and W. Hong.
    Journal of Korean Vacuum Society 5(1) (1996) 25.

1994

  • A Study on Korean Anthracite by Instrumental Neutron Activation Analysis.

    N.B. Kim, H.J. Woo, K.Y. Lee, W. Hong, S.K. Chun and K.S. Park.
    Analytical Science and Technology 7(4) (1994) 477.

  • Measurement of Gold Coating Thickness by PIXE.

    N.B. Kim, H.J. Woo, Y.S. Kim, D.K. Kim, J.K. Kim, H.W. Choi and K.S. Park.
    Analytical Science and Technology 7(4) (1994) 471.

  • Determination of Impurities in Niobium Metal by a Radiochemical Neutron Activation Analysis.

    K.S. Park, N.B. Kim, H.J. Woo, K.Y. Lee, Y.Y. Yoon and W. Hong.
    Journal of Radioanalytical and Nuclear Chemistry 179(1) (1994) 81.

  • The Principle and applications of Accelerator Mass Spectrometry.

    K.S. Park and H.J. Woo.
    Analytical Science and Technology 7(3) (1994) 69.

  • PIXE Analysis for Elemental Analysis in Aerosol.

    D.K. Kim, H.W. Choi, H.J. Woo, Y.S. Kim, W. Hong, N.B. Kim, J.H. Lee.
    Journal of Korean Atmosphere Preservation Research Association 10(2) (1994) 90.

  • The Purdue Rare Isotope Measurement Laboratory.

    D. Elmore, L. Dep, R. Flack, M.J. Hawksworth, D.L. Knies, X.Z. Ma, E.S. Michlovich, T.E. Miller,  K.A. Mueller,  F.A. Rickey,  P. Sharma, P.C. Simms, H.J. Woo, M.E. Lipschutz, S. Vogt, M.S. Wang and M.C. Monaghan.
    Nuclear Instruments and Methods B92 (1994) 65.

1993

  • Hydrogen Depth Profiling by Nuclear Resonance Reaction.

    Y.S. Kim, J.K. Kim, W. Hong, D.K. Kim, S.Y. Cho, H.J. Woo, and N.B. Kim.
    Journal of the Korean Vacuum Society 2(4) (1993) 416.

  • A Device for Improving Detection Sensitivities of Light Elements in Steel.

    N.B. Kim, H.J. Woo, D.K. Kim, H.W. Choi, K. Y. Lee and K.S. Park.
    Nuclear Instruments and Methods B75 (1993) 379.

  • Determination of Impurities in Tantalum by a Radiochemical Neutron Activation Analysis.

    K.S. Park, N.B. Kim, H.J. Woo, et al..
    Journal of Radioanalytical and Nuclear Chemistry 168(2) (1993) 497.

  • Interference in Neutron Activation Analysis of Rocks by Uranium Fission.

    K.S. Park, N.B. Kim, H.J. Woo, K.Y. Lee, Y.Y. Yoon and J.H. Lee.
    Journal of Radioanalytical and Nuclear Chemistry 168(1) (1993) 153.

1992

  • Determination of U and Th in Tungsten by a Radiochemical NAA.

    N.B. Kim, K.S. Park, H.J. Woo, et al..
    Journal of Radioanalytical and Nuclear Chemistry 160(2) (1992) 539.

  • Determination of Rare-earth elements in Steels by a Radiochemical NAA.

    N.B. Kim, K.S. Park, H.J. Woo, et al..
    Journal of Radioanalytical and Nuclear Chemistry 160(2) (1992) 529.

  • Microstructure of the Pd-silicide Induced by Ion Beam Mixing at Room Temperature.

    N.B. Kim, J.K. Kim, H.J. Woo, C.N. Whang, et al..
    Journal of the Korean Physical Society 25(2) (1992) 141.

1991

  • Determination of Parameters in 16O(α,α)16O Elastic Resonance Scattering and its Application to the Analysis of Thin Oxide Layer.

    S.J. Ye, H.I. Bak, H.J. Woo, et al..
    Korean Applied Physics(Korean Physical Society 4(4) (1991) 439.

  • Determination of Impurities in Semiconductor Grade Silicon by INAA.

    K.S. Park, N.B. Kim, H.J. Woo, et al..
    Journal of Radioanalytical and Nuclear Chemistry 151(2) (1991) 373.

1990

  • Computerized Neutron Activation Analysis System in KIER.

    N.B. Kim, Y.S. Kim, H.J. Woo, et al..
    Analytical Science and Technology 3(2) (1990) 243.

  • Proton Induced X-ray Emission Analysis System and Test Analysis of Reference Materials.

    N.B. Kim, H.J. Woo, et al..
    Analytical Science and Technology 3(2) (1990) 301.

  • An Environmental Research on Trace Elements in Fresh-Water Fish by Neutron Activation Analysis.

    K.S. Park, N.B. Kim, H.J. Woo, et al..
    International Conference on Nuclear Analytical Methods in the Life Sciences, Biological Trace Element Research 26/27 (1990) 347.

  • Ion Beam Mixing of Pd/Cu Thin Film.

    C.N. Whang, H.J. Woo, et al..
    Journal of the Korean Physical Society 23(4) (1990) 345.